ZHANG, Chengang. Software Defect Prediction under Label Scarcity: A Few-Shot Prototypical Learning and Adaptive Fusion Method. Computers and Artificial Intelligence, [S. l.], v. 3, n. 6, p. 120–132, 2026. DOI: 10.70267/cai.v3n6.120132. Disponível em: https://journals.zeuspress.org/index.php/CAI/article/view/1755. Acesso em: 12 nov. 2026.