Cui B, Yin Y, Xiao Y, Wang S, Xiao X. A Review of Deep Learning-Based 15Visual Inspection Techniques for Chip Surface Defects. CAI [Internet]. 2026 May 29 [cited 2026 Jun. 2];3(3):98-103. Available from: https://journals.zeuspress.org/index.php/CAI/article/view/832