CHEN, Siying. A Review of Industrial Fault Diagnosis Technologies Based on Machine Learning. Exploring Science Academic Conference Series, [S. l.], v. 14, p. 124–134, 2026. DOI: 10.70267/ic-aimees.202602124134. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/688. Acesso em: 1 apr. 2026.