HAN, Yufan. The Application of Machine Learning and Pattern Recognition in Education: Opportunities and Challenges. Exploring Science Academic Conference Series, [S. l.], v. 16, p. 160–167, 2026. DOI: 10.70267/aitia.2026160167. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/1310. Acesso em: 14 sep. 2026.