JI, Yuhang. Evolution of Few-Shot Image Classification: A Survey from Metric Learning to Large Model Fine-Tuning. Exploring Science Academic Conference Series, [S. l.], v. 16, p. 50–55, 2026. DOI: 10.70267/aitia.20265055. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/1298. Acesso em: 14 sep. 2026.