SHI, Yifan. The Integration of Artificial Intelligence and Big Data: A Review of Technologies, Applications, and Challenges. Exploring Science Academic Conference Series, [S. l.], v. 16, p. 252–258, 2026. DOI: 10.70267/aitia.2026252258. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/1322. Acesso em: 14 sep. 2026.