LU, Yilin. From Monitoring to Supervised Control: A Capability- Maturity Perspective on Digital Twins in Smart Manufacturing. Exploring Science Academic Conference Series, [S. l.], v. 16, p. 326–335, 2026. DOI: 10.70267/aitia.2026326335. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/1332. Acesso em: 14 sep. 2026.