XIE, Shurui. Predicting Bond Default Risk Based on the XGBoost Model. Exploring Science Academic Conference Series, [S. l.], v. 19, p. 61–67, 2026. DOI: 10.70267/icfmb.2026196167. Disponível em: https://journals.zeuspress.org/index.php/conference/article/view/1056. Acesso em: 14 aug. 2026.